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Next Generation HALT and HASS: Robust Design of Electronics and Systems (Quality and Reliability Engineering Series)
Author(s): Kirk A. Gray, John J. Paschkewitz
Edition: 1
Publish Date: 2016 Publisher: Wiley Format: Hardcover ISBN 10: 1118700236
ISBN 13: 9781118700235
Edition: 1
Publish Date: 2016 Publisher: Wiley Format: Hardcover ISBN 10: 1118700236
ISBN 13: 9781118700235
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VitalSource Buy eTextbook  | $101.00 FREE $101.00  |
eCampus eTextbook (1825 Days) | $113.63 FREE $113.63  |
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AbeBooks New | $104.49 Standard Shipping: $2.64 $107.13 |
AbeBooks Used | $105.53 Standard Shipping: $2.64 $108.17 |
eCampus New | $134.21 FREE $134.21 |