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Next Generation HALT and HASS: Robust Design of Electronics and Systems (Quality and Reliability Engineering Series)
Author(s): Kirk A. Gray, John J. Paschkewitz
Edition: 1
Publish Date: 2016 Publisher: Wiley Format: Hardcover ISBN 10: 1118700236
ISBN 13: 9781118700235
Edition: 1
Publish Date: 2016 Publisher: Wiley Format: Hardcover ISBN 10: 1118700236
ISBN 13: 9781118700235
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AbeBooks New  | $83.48 Standard Shipping: $2.64 $86.12  |
AbeBooks Used | $97.00 FREE $97.00 |
eCampus New | $133.67 FREE $133.67 |